Semiconductor device

ABSTRACT

A semiconductor device includes a p-type semiconductor layer and an n-type semiconductor layer that are joined by sandwiching a depletion layer with a thickness that allows transmission of a plurality of electrons and holes by direct-tunneling.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a divisional of U.S. application Ser. No.12/648,162, filed Dec. 28, 2009, which is still pending, and both arebased upon and claim the benefit of priority of the prior JapanesePatent Application Nos. 2009-078548 and 2009-188320 filed on Mar. 27,2009 and Aug. 17, 2009, respectively, the entire contents of which areincorporated herein by reference.

FIELD OF THE INVENTION

The present disclosure relates to a semiconductor device, and inparticular, relates to a semiconductor device that is suitable fordetecting a weak high-frequency electrical signal.

BACKGROUND

A low noise amplifier and a detector are used together in order todetect a weak electrical wave in a millimeter wave field. For example, aSchottky diode is used for this detector.

FIG. 1A illustrates one example of current-voltage characteristics of aSchottky diode. The horizontal axis indicates a voltage, while thevertical axis indicates a current. The positive direction of thehorizontal axis corresponds to a backward voltage. The dotted line 100in FIG. 1A illustrates normal current-voltage characteristics. When aforward voltage exceeds an offset voltage Vos, the current abruptlyrises. Thus, it is difficult to obtain sufficient detectioncharacteristics in a range where an input voltage is equal to or lowerthan the offset voltage Vos.

The solid line 101 in FIG. 1 indicates current-voltage characteristicswhen a bias for correcting an offset Vos is applied. In this case, evenif the applied forward voltage is infinitesimal, the current risesabruptly. However, a backward current Ir increases when the backwardvoltage is applied. Accordingly, the detection characteristicsdeteriorate.

FIG. 1B illustrates one example of current-voltage characteristics of anEsaki diode. The horizontal axis indicates a voltage, while the verticalaxis indicates a current. The positive direction of the horizontal axiscorresponds to a forward voltage. When a forward voltage is applied,electrons tunnel from a conduction band of an n-type layer to a valenceband of a p-type layer. Moreover, when the forward voltage is furtherincreased, electrons stop tunneling. This is because an energy level ata lower end of the valance band of the n-type layer is at a band gap ofthe p-type layer. As a result, a negative resistance appears.

Applying a backward voltage makes a current flow because electrons inthe valence band of the p-type layer tunnel to the conduction band ofthe n-type layer. Thus, a backward current flows without exhibiting anoffset voltage such as in a Schottky diode. Therefore, non-linearcharacteristics between the voltage and the current are obtained.

A peak current appears in a voltage range that is lower than a voltagein which a negative resistance appears under a forward bias. This peakcurrent is observed as a backward leak current when an Esaki diode isused as a detector.

A backward diode is known that suppresses tunneling of electrons from aconduction band of an n-type layer to a valence band of a p-type layerunder a forward bias. FIG. 1C illustrates one example of current-voltagecharacteristics of a backward diode. A current is lowered when a forwardbias is applied compared with a current of an Esaki diode. Using abackward diode as a detector may better suppress a backward leak currentcompared with an Esaki diode.

Moreover, a backward diode that uses a p-type GaSb and an n-type InAs isknown (for example, refer to Patent application publication No.2003-518326).

FIG. 2 is an energy-band diagram of the backward diode. An AlSb layerwith a thickness that allows tunneling of electrons is disposed betweenan n-type InAs layer and a p-type GaSb layer. Although, in actuality,energy band bending is caused near an interface between each layer, thisis not illustrated in FIG. 2. A valence band of a p-type GaSb layer anda conduction band of an n-type InAs layer partially overlap at bothsides of the AlSb layer.

When a positive voltage is applied to the n-type InAs layer, electronsin the valence band of the p-type GaSb layer are transported to theconduction band of the n-type InAs layer by tunneling, as indicated bythe solid line arrow. An energy level of electrons at the lower end ofthe conduction band of the n-type InAs layer is within a band gap of thep-type GaSb layer under a state in which a given size of a positivevoltage is applied to the p-type GaSb layer. Hence, the current does notflow.

The backward diode may obtain favorable detection characteristics bycausing interband tunneling.

It is assumed that an infinitesimal positive voltage is applied to thep-type GaSb layer of the backward diode illustrated in FIG. 2. When anapplied voltage is infinitesimal to the extent that the energy level ofelectrons at the lower end of the conduction band of an n-type InAslayer is in the valence band of the p-type GaSb layer, electrons in theconduction band of the n-type InAs layer are transported to the valenceband of the p-type GaSb layer by tunneling as indicated by the dashedarrow in FIG. 2. Thus, sufficient detection characteristics may not beobtained in the infinitesimal voltage range.

SUMMARY

According to an aspect of the invention, a semiconductor device includesa p-type semiconductor layer and an n-type semiconductor layer that arejoined by sandwiching a depletion layer with a thickness that allowstransmission of a plurality of electrons and holes by direct tunneling,wherein a forbidden band of the n-type semiconductor layer and aforbidden band of the p-type semiconductor layer partially overlap undera state in which a flat band voltage that makes energy bands of then-type semiconductor layer and the p-type semiconductor layer flat isapplied between the n-type semiconductor layer and the p-typesemiconductor layer; and an energy level of a plurality of electrons atan upper end of a valence band of the p-type semiconductor layer isequal to or higher than an energy level of a plurality of electrons at alower end of a conduction band of the n-type semiconductor layer in aregion that is further away from the depletion layer than a bendingportion of an energy band which is contiguous with the depletion layerunder an equilibrium state without any voltage being applied.

According to an another aspect of the invention, a semiconductor deviceincludes a barrier layer with a thickness that allows transmission of aplurality of electrons by direct tunneling; and a p-type semiconductorlayer and an n-type semiconductor layer that are disposed so as tosandwich the barrier layer, wherein a band gap of the barrier layer iswider than band gaps of the n-type semiconductor layer and the p-typesemiconductor layer. An energy level of a plurality of holes at an upperend of a valence band of the barrier layer is higher than an energylevel of a plurality of holes at an upper end of a valence band of then-type semiconductor layer under a state in which a flat band voltagethat makes energy bands of the n-type semiconductor layer and the p-typesemiconductor layer flat is applied between the n-type semiconductorlayer and the p-type semiconductor layer; and an energy level of aplurality of electrons at the upper end of the valence band of thep-type semiconductor layer is equal to or higher than an energy level ofa plurality of electrons at the lower end of the conduction band of then-type semiconductor layer in a region that is further away from abending portion of an energy band at an interface between the barrierlayer and the n-type semiconductor layer and an interface between thebarrier layer and the p-type semiconductor layer under an equilibriumstate without any voltage is applied.

According to an another aspect of the invention, a receiver comprising adetector and an amplifier that is coupled to the detector. The detectorincludes a p-type semiconductor layer and an n-type semiconductor layerthat are joined by sandwiching a depletion layer with a thickness thatallows transmission of a plurality of electrons and holes by directtunneling, wherein a forbidden band of the n-type semiconductor layerand a forbidden band of the p-type semiconductor layer partially overlapunder a state in which a flat band voltage that makes energy bands ofthe n-type semiconductor layer and the p-type semiconductor layer flatis applied between the n-type semiconductor layer and the p-typesemiconductor layer; and an energy level of a plurality of electrons atan upper end of a valence band of the p-type semiconductor layer isequal to or higher than an energy level of a plurality of electrons at alower end of a conduction band of the n-type semiconductor layer in aregion that is further away from the depletion layer than a bendingportion of the energy band which is contiguous with the depletion layerunder an equilibrium state without any voltage is applied.

According to an another aspect of the invention, a receiver includes adetector, and an amplifier that is coupled to the detector. The detectorincludes a barrier layer with a thickness that allows transmission of aplurality of electrons by direct tunneling, and a p-type semiconductorlayer and an n-type semiconductor layer that are disposed so as tosandwich the barrier layer, wherein a band gap of the barrier layer iswider than band gaps of the n-type semiconductor layer and the p-typesemiconductor layer; an energy level of a plurality of holes at an upperend of a valence band of the barrier layer is higher than an energylevel of a plurality of holes at an upper end of a valence band of then-type semiconductor layer under a state in which a flat band voltagethat makes energy bands of the n-type semiconductor layer and the p-typesemiconductor layer flat is applied between the n-type semiconductorlayer and the p-type semiconductor layer; and an energy level of aplurality of electrons at an upper end of a valence band of the p-typesemiconductor layer is equal to or higher than an energy level of aplurality of electrons at a lower end of a conduction band of the n-typesemiconductor layer in a region that is further away from an interfacebetween the barrier layer and the n-type semiconductor layer, and aninterface between the barrier layer and the p-type semiconductor layerthan a bending portion of the energy band at the interfaces under anequilibrium state without any voltage being applied.

The object and advantages of the invention will be realized and attainedby means of the elements and combinations particularly pointed out inthe claims.

It is to be understood that both the foregoing general description andthe following detailed description are exemplary and explanatory and arenot restrictive of the invention.

BRIEF DESCRIPTION OF DRAWINGS

FIGS. 1A, 1B, and 1C are graphs illustrating current-voltagecharacteristics of Schottky diode, Esaki diode, and a backward diode ofthe related arts, respectively;

FIG. 2 is an energy band diagram of a backward diode using interbandtunneling of a related art;

FIGS. 3A to 3D are sectional views of a manufacturing method ofsemiconductor device according to a first embodiment;

FIGS. 4A to 4E are energy band diagrams when various biases are appliedto the semiconductor device according to the first embodiment;

FIG. 5 is a graph illustrating current-voltage characteristics of thesemiconductor device according to the first embodiment;

FIG. 6 is an energy band diagram of the semiconductor device of analternative embodiment according to the first embodiment;

FIGS. 7A to 7E are sectional views illustrating a manufacturing methodof a semiconductor device according to a second embodiment;

FIGS. 8A to 8C are sectional views illustrating a manufacturing methodof the semiconductor device according to a third embodiment;

FIG. 9 is an energy band diagram of the semiconductor device accordingto the third embodiment;

FIG. 10A is a graph illustrating measurement results of current-voltagecharacteristics of the semiconductor devices according to the firstembodiment and the third embodiment, and FIG. 10B is a diagramillustrating detection sensitivity;

FIGS. 11A to 11C are sectional views illustrating a manufacturing methodof the semiconductor device according to a fourth embodiment;

FIG. 12 is a graph illustrating measurement results of current-voltagecharacteristics of the semiconductor device according to the fourthembodiment;

FIG. 13 is an energy band diagram of a semiconductor device according tothe fourth embodiment;

FIGS. 14A to 14H are sectional views illustrating a manufacturing methodof a semiconductor device according to a fifth embodiment;

FIG. 15 is an equivalent circuit diagram of a receiver using thesemiconductor device according to the fifth embodiment;

FIG. 16A is an energy band diagram of a semiconductor device accordingto the sixth embodiment, and FIG. 16B is a sectional view of thesemiconductor device;

FIGS. 17A and 17B are sectional views of a semiconductor device of analternative embodiment according to a sixth embodiment;

FIG. 18A is a sectional view of a semiconductor device according to aseventh embodiment, and FIG. 18B is an energy band diagram of thesemiconductor device;

FIGS. 19A to 19C are graphs illustrating simulation results of theenergy band diagram when impurity concentrations of the n-typesemiconductor layer are changed;

FIG. 20A is an energy band diagram of the semiconductor device accordingto an eighth embodiment, and FIGS. 20B and 20C are energy band diagramsof the alternative embodiments according to the eighth embodiment; and

FIG. 21A is an energy band diagram according to a ninth embodiment, andFIGS. 21B and 21C are energy band diagrams of the semiconductor deviceof the alternative embodiments according to the ninth embodiment.

DESCRIPTION OF EMBODIMENTS First Embodiment

As illustrated in FIG. 3A, the following layers are formed over asemi-insulating InP semiconductor substrate 10: a buffer layer 11 of anintrinsic InAlAs (with a thickness of about 300 nm), an n-typesemiconductor layer 12 of an n-type InGaAs (with a thickness of about200 nm), a barrier layer 13 of an intrinsic InAlAs 13 (with a thicknessof about 3 nm), and a p-type semiconductor layer 14 of a p-type GaAsSb(with a thickness of about 100 nm). Metal organic chemical vapordeposition (MOCVD) may be used for the formation of these layers.Elemental ratios of the layers are selected so as to substantiallylattice-match with the semiconductor substrate 10 that is made up ofInP.

The thickness of the barrier layer 13 is not limited to about 3 nm butmay be any thickness as long as electrons may be passed by directtunneling. For example, the thickness of the barrier layer 13 ispreferably 10 nm or less. Moreover, considering stability of the filmformation process, it is preferable that the thickness of the barrierlayer 13 be 3 nm or more.

An impurity concentration of the n-type semiconductor layer 12 and thatof the p-type semiconductor layer 14 may be, for example, about 1×10¹⁹cm⁻³. In a semiconductor layer to which a large amount of impurities isdoped, the Fermi level may be in the conduction band or in the valenceband, or in the forbidden band of a lower bottom of the conduction bandor an upper end of the valence band close to a pole.

As illustrated in FIG. 3B, the p-type semiconductor layer 14 and thebarrier layer 13 are etched using a resist pattern 20 as an etchingmask. For example, a mixture liquid of phosphoric acid and hydrogenperoxide may be used for etching the p-type semiconductor layer 14 andthe barrier layer 13. After etching the p-type semiconductor layer 14and the barrier layer 13, the resist pattern 20 is removed. The barrierlayer 13 and the p-type semiconductor layer 14 are kept over a part ofthe region of the n-type semiconductor layer 12.

As illustrated in FIG. 3C, the n-type semiconductor layer 12 is etchedusing a resist pattern 21 as an etching mask. The resist pattern 21, ina planar view, covers the p-type semiconductor layer 14. For example, amixture liquid of phosphoric acid and hydrogen peroxide may be used foretching the n-type semiconductor layer 12. After etching the n-typesemiconductor layer 12, the resist pattern 21 is removed. The portion ofthe n-type semiconductor layer 12 that is covered by the resist pattern21 is larger than the above p-type semiconductor layer 14.

As illustrated in FIG. 3D, an n-side electrode 15 is formed over theextended portion of the n-type semiconductor layer 12, and a p-sideelectrode 16 is formed over the p-type semiconductor layer 14. Then-side electrode 15 and the p-side electrode 16 are made up of alaminated structure, for example, of a Ti film with a thickness of about10 nm, and a Pt film with a thickness of about 30 nm, and an Au filmwith a thickness of about 300 nm. The n-side electrode 15 and the p-sideelectrode are formed, for example, by a vapor deposition method or alift-off method. The n-side electrode 15 is in ohmic contact with then-type semiconductor layer 12, while the p-side electrode 16 is in ohmiccontact with the p-type semiconductor layer 14. Thus, a diode isobtained that is made up of a pair of terminals of the n-side electrode15 and the p-side electrode 16.

FIG. 4A is an energy band diagram of the n-type semiconductor layer 12,the barrier layer 13, and the p-type semiconductor layer 14 of thesemiconductor device according to the first embodiment under a flat bandstate. A flat band voltage is applied between the n-type semiconductorlayer 12 and the p-type semiconductor layer 14, and the energy bandbending is reduced to be approximately flat near the interface betweenthe n-type semiconductor layer 12 and the barrier layer 13, and near theinterface between the barrier layer 13 and the p-type semiconductorlayer 14.

In the n-type semiconductor layer 12, a Fermi level Ef is in theconduction band. In the p-type semiconductor layer 14, the Fermi levelEf is in the valence band. In other words, the n-type semiconductorlayer 12 and the p-type semiconductor layer 14 are degenerated.

The band gap width of the barrier layer 13 is wider than the band gapwidths of the n-type semiconductor layer 12 and the p-type semiconductorlayer 14. The lower end of the conduction band Ec of the n-typesemiconductor layer 12 is lower than the lower end of the conductionband Ec of the p-type semiconductor layer 14, and the upper end of thevalence band Ev of the n-type semiconductor layer 12 is lower than theupper end of the valence band Ev of the p-type semiconductor layer 14.Moreover, the forbidden band of the n-type semiconductor layer 12partially overlaps with the forbidden band of the p-type semiconductorlayer 14.

The barrier layer 13 disposed between the n-type semiconductor layer 12and the p-type semiconductor layer 14 forms a depletion layer.

FIG. 4B illustrates an energy band diagram when no voltage is applied,in other words, under an equilibrium state. The Fermi level Ef in then-type semiconductor layer 12 is substantially the same as the Fermilevel Ef in the p-type semiconductor layer 14. The energy band of then-type semiconductor layer 12 bends upward near the interface betweenthe n-type semiconductor layer 12 and the barrier layer 13. The energyband of the p-type semiconductor layer 14 bends downward near theinterface between the p-type semiconductor layer 14 and the barrierlayer 13. The thickness of the region where the energy bands benddepends on the impurity concentration of the n-type semiconductor layer12. As the impurity concentration increases, the region where the bendsare caused becomes thinner.

The energy band becomes substantially flatter in a region away from theinterfaces than the bending portion of the energy band at the interfacebetween the n-type semiconductor layer 12 and the barrier layer 13 andthe interface between the barrier layer 13 and the p-type semiconductorlayer 14. The energy level of the upper end of the valence band of thep-type semiconductor layer 14 is substantially equal to or higher thanthe energy level of the lower end of the conduction band of the n-typesemiconductor layer 12 in the region where the energy band issubstantially flat.

The region in the n-type semiconductor layer 12 that is in contact withthe barrier layer 13, the region in the p-type semiconductor layer thatis in contact with the barrier layer 13, and the barrier layer 13 form adepletion layer. The thickness of the depletion layer allowstransmission of electrons and holes by direct tunneling.

FIG. 5 illustrates current-voltage characteristics of the semiconductordevice according to the first embodiment. The horizontal axis indicatesvoltage, while the vertical axis indicates current. The direction of thevoltage that makes the potential of the p-type semiconductor layer 14higher than that of the n-type semiconductor layer 12 is assumed to bepositive (forward direction). The state in which no voltage is appliedcorresponds to the origin 2B in FIG. 5.

As illustrated in FIG. 4C, applying a backward voltage to thesemiconductor device makes electrons in the valence band of the p-typesemiconductor layer 14 move through a potential barrier at the barrierlayer 13 and the bending portion of the energy band of the n-typesemiconductor layer 12 by direct tunneling to the conduction band of then-type semiconductor layer 12. Thus, the current abruptly rises as thebackward voltage increases as illustrated in the graph area 2C in FIG.5. In FIGS. 4C to 4E, the Efp and the Efn indicate pseudo-Fermi levels.

The bending portions of the energy band are thin when impurityconcentrations of the n-type semiconductor layer 12 and the p-typesemiconductor layer 14 are sufficiently high. Therefore, applying evenan infinitesimal backward voltage makes a potential barrier thin enoughto allow direct tunneling of electrons. The bending portion of theenergy band becomes thick when impurity concentrations of the n-typesemiconductor layer 12 and the p-type semiconductor layer 14 are notsufficiently high. Therefore, the potential barrier may not become thinenough when the backward voltage is infinitesimal, and a current may notrise by direct tunneling of electrons. It is preferable that theimpurity concentrations of the n-type semiconductor layer 12 and thep-type semiconductor layer 14 are approximately 1×10¹⁸ cm⁻³ or more tomake a current rise when the backward voltage is infinitesimal.

FIG. 4D is an energy band diagram when an infinitesimal forward voltageis applied to the semiconductor device. The bending portions of theenergy band in the n-type semiconductor layer 12 and the p-typesemiconductor layer 14 are reduced to approach a flat-band state. Underthe near flat-band state, the energy level in the lower end of theconduction band of the n-type semiconductor layer 12 is within theforbidden band of the p-type semiconductor layer 14. Hence, electronsnear the lower end of the conduction band of the n-type semiconductorlayer 12 are not transported to the p-type semiconductor layer 14. Thisstate corresponds to the area 2D where almost no current flows in thegraph illustrated in FIG. 5. In other words, almost no current flowswhen a forward voltage is infinitesimal.

An energy level of holes at the upper end of the valence band of thebarrier layer 13 is higher than the energy level of holes at the upperend of the valence band of the n-type semiconductor layer 12 and at theupper end of the valence band of the p-type semiconductor layer 14.Therefore, the barrier layer 13 forms a potential barrier for the holesunder a forward bias state illustrated in FIG. 4D. As a result, acurrent caused by holes under the forward bias state is suppressed aswell.

As illustrated in FIG. 4E, increasing a forward voltage allows electronsin the conduction band of the n-type semiconductor layer 12 to betransported to the conduction band of the p-type semiconductor layer 14by passing the potential barrier of the barrier layer 13. This statecorresponds to the current rising part 2E in the graph illustrated inFIG. 5.

As illustrated in FIG. 5, sufficient detection characteristics areobtained in the infinitesimal voltage range. As contrasted with generaldiodes, a current flows when a reverse bias is applied in aninfinitesimal voltage range, whereas no current flows when a forwardbias is applied in an infinitesimal voltage range.

A forward current flows by interband tunneling when an infinitesimalforward bias as illustrated in FIG. 4C is applied under a condition thatan energy level of electrons at the lower end of the conduction band ofthe n-type semiconductor layer 12 is lower than the energy level ofelectrons at the upper end of the valence band of the p-typesemiconductor layer 14 when a flat band voltage is applied. In the firstembodiment, as illustrated in FIG. 4A, since the energy level ofelectrons in the lower end of the conduction band of the n-typesemiconductor layer 12 is in the forbidden band of the p-typesemiconductor layer 14 under a flat band state, a current may not flowby interband tunneling under a condition that an infinitesimal forwardbias is applied. Accordingly, a leak current under a condition that aforward bias is applied may be suppressed.

According to the above described first embodiment, the n-typesemiconductor layer 12, the barrier layer 13, and the p-typesemiconductor layer 14 are substantially lattice-matched with thesemiconductor substrate 10. However, the lattice-matching may not beneeded. The thickness of each layer may be a critical film thickness orless when the lattice-matching is not employed.

According to the first embodiment, InGaAs is used for the n-typesemiconductor layer 12, while GaAsSb is used for the p-typesemiconductor layer 14. However, other semiconductor materials may beused as long as such materials satisfy the following conditions.

First, an energy level of electrons in the lower end of the conductionband of the n-type semiconductor layer 12 is lower than an energy levelof the lower end of the conduction band of the p-type semiconductorlayer 14.

Secondly, an energy level of the upper end of the valence band of then-type semiconductor layer 12 is lower than an energy level of the upperend of the valence band of the p-type semiconductor layer 14.

Thirdly, a forbidden band of the n-type semiconductor layer 12 partiallyoverlaps with a forbidden band of the p-type semiconductor layer 14under a condition that a flat voltage is applied between the n-typesemiconductor layer 12 and the p-type semiconductor layer 14.

Fourthly, an energy level of electrons at the upper end of the valenceband of the p-type semiconductor layer 14 is equal to or higher than anenergy level of the lower end of the conduction band of the n-typesemiconductor layer 12 in a region further away from the interfaces thanthe bending portions of the energy band at the interface between thebarrier layer 13 and the n-type semiconductor layer 12, and theinterface between the barrier layer 13 and the p-type semiconductorlayer 14, where the energy band is flat under an equilibrium state whenno voltage is applied.

When materials that satisfy all of the above described conditions areused, applying a reverse bias between the n-type semiconductor layer 12and the p-type semiconductor layer 14 makes electrons in the valenceband of the p-type semiconductor layer 14 directly tunnel the barrierlayer and be transported to the conduction band of the n-typesemiconductor layer 12. No transportation of electrons by interbandtunneling is caused when a forward voltage is applied.

Examples of III-V compound semiconductors used for the n-typesemiconductor layer 12 may include In and As such as InAlGaAs, InGaAsP,and InAsP. Examples of III-V compound semiconductors used for the p-typesemiconductor layer 14 may include As and Sb such as GaAlAsSb, andInGaAsSb.

FIG. 6 is an energy band diagram of a semiconductor device according toan alternative embodiment according to the first embodiment. In thisalternative embodiment, intrinsic InP is used instead of intrinsicInAlAs as a barrier layer 13. Using the intrinsic InP as the barrierlayer 13 may raise a potential barrier against holes. Moreover, theintrinsic InP as the barrier layer 13 serves as an etching stopper layerwhen etching the p-type semiconductor layer 14 illustrated in FIG. 3B.Therefore, the alternative embodiment may reduce variations in thethicknesses of the n-type semiconductor layer 12 that is exposed afterthe etching.

When thicknesses of the n-type semiconductor layer 12 becomesubstantially constant, variations in electrical resistance between then-type semiconductor layer 12 that is immediately below the barrierlayer 13 and the n-side electrode 15 may be reduced.

Second Embodiment

A manufacturing method of a semiconductor device according to a secondembodiment will be described by referring to FIGS. 7A to 7E. Thedescription below mainly discusses processes that are different from themanufacturing method according to the first embodiment, and the sameconfigurations as in the first embodiment may not be described.

As illustrated in FIG. 7A, according to the second embodiment, an n-sideohmic contact layer 25 and an etching stopper layer 26 are disposedbetween a buffer layer 11 and an n-type semiconductor layer 12. Theetching stopper layer 26 is disposed between the n-side ohmic contactlayer 25 and the n-type semiconductor layer 12. The n-side ohmic contactlayer 25 is formed of an n-type semiconductor that is made up ofsubstantially the same composition as the n-type semiconductor layer 12.The etching stopper layer 26 is formed, for example, with an n-typesemiconductor that includes In and P, for example, an n-type InP. Thethickness of the etching stopper layer 26 is, for example, about 5 nm,and an n-type impurity concentration is about 5×10¹⁸ cm⁻³.

As illustrated in FIG. 7B, layers from a p-type semiconductor layer 14to the n-type semiconductor layer 12 are patterned using, for example, amixture liquid of phosphoric acid and hydrogen peroxide. Etching speedof a compound semiconductor that includes P as a V-group element is slowfor this etchant. As a result, etching may be stopped with highrepeatability upon exposure of the etching stopper layer 26.

As illustrated in FIG. 7C, the exposed part of the etching stopper layer26 is etched using, for example, a mixture liquid of hydrochloric acidand phosphoric acid. The etching may be stopped with high repeatabilityupon exposure of the n-side ohmic contact layer 25.

As illustrated in FIG. 7D, the n-side ohmic contact layer 25 ispatterned. For example, this patterning is performed under substantiallythe same condition as the patterning of the n-type semiconductor layer12 according to the first embodiment illustrated in FIG. 3C. The n-sideohmic contact layer 25, in a planar view, includes a region that islarger than a laminated structure from a p-type semiconductor layer 14to the etching stopper layer 26.

As illustrated in FIG. 7E, an n-side electrode 15 is formed over theextended region of the n-side ohmic contact layer 25 and a p-sideelectrode 16 is formed over the surface of the p-type semiconductorlayer 14.

In the second embodiment, the process illustrated in FIG. 7B may stopetching at the etching stopper layer 26, and the process illustrated inFIG. 7C may stop etching at the n-side ohmic contact layer 25. Thus, asurface of the n-side ohmic contact layer 25 for allowing ohmic contactof the n-side electrode 15 may be exposed with high repeatability.

Variations in the thicknesses of the n-side ohmic contact layer 25 maybe reduced. Thus, variations in electrical resistance in a region forprojecting the electrode laterally may be reduced.

In the second embodiment, an n-type InP etching stopper layer 26 isinterposed between the n-type InGaAs n-side ohmic contact layer 25 andthe n-type semiconductor layer 12. Note that the etching stopper layer26 may not influence current-voltage characteristics of the diodebecause the etching stopper layer 26 is sufficiently thin to allowdirect tunneling of electrons, and is degenerated due to doping of alarge amount of n-type impurities.

Third Embodiment

A manufacturing method of a semiconductor device according to a thirdembodiment will be described by referring to FIGS. 8A to 8C. Thedescription below only discusses processes that are different from themanufacturing method according to the first embodiment, andconfigurations the same as those in the first embodiment may not bedescribed.

As illustrated in FIG. 8A, in the third embodiment, an n-typesemiconductor layer 12 is divided into an In-poor composition layer 12Awith a relatively low In composition ratio, and an In-rich compositionlayer 12B with a relatively high In composition ratio. The In-richcomposition layer 12B is interposed between the In-poor compositionlayer 12A and a barrier layer 13.

The In-poor composition layer 12A has substantially the same compositionratio as the n-type semiconductor layer 12 of the semiconductor deviceaccording to the first embodiment, and is substantially lattice-matchedwith an InP semiconductor substrate 10. For example, the In compositionratio of the In-poor composition layer 12A may be 0.53, and that of theIn-rich composition layer 12B is higher than 0.53, and may be 0.6. Thethickness of the In-poor composition layer 12A may be, for example about200 nm, while the thickness of the In-rich composition layer, forexample, may be about 10 nm. N-type impurity concentrations of theIn-poor composition layer 12A and the In-rich composition layer 12B aresubstantially the same as the n-type impurity concentration of then-type semiconductor layer 12 according to the first embodiment.

A p-side ohmic coupling layer 31 and a p-side ohmic contact layer 32 arelaminated over a p-type semiconductor layer 14. The p-side ohmiccoupling layer 31 and the p-side ohmic contact layer 32 are formed withn-type compound semiconductors that includes In, Ga, and As, forexample, an n-type InGaAs. The n-type impurity concentration is about1×10¹⁹ cm⁻³.

The In composition ratio of the p-side ohmic coupling layer 31 is, forexample, 0.8, which is higher than an InP lattice-matched compositionratio, and the thickness of the p-side ohmic coupling layer 31 is about10 nm. The In composition ratio of the p-side ohmic contact layer 32 maybe, for example, 0.53 and the thickness may be about 50 nm. In otherwords, the p-side ohmic contact layer 32 is substantiallylattice-matched with the InP semiconductor substrate 10.

A WSi conductive layer 35 is formed over the p-side ohmic contact layer32 by sputtering. The conductive layer 35 is patterned by dry etchingusing etching gas such as CF₄ or SF₆.

As illustrated in FIG. 8B, each layer from the p-side ohmic contactlayer 32 to the bottom surface of the In-rich composition layer 12B isetched using the conductive layer 35 as an etching mask. For thisetching, a wet etching, for example, using a mixture liquid ofphosphoric acid and hydrogen peroxide may be employed. The surface ofthe In-poor composition layer 12A may be thinly etched. A mesa 36 isobtained that is made up of a laminated structure from the In-richcomposition layer 12B to the p-side ohmic contact layer 32. The sides ofthe mesa 36 are side-etched, and an eave-like structure is obtained inwhich the edge of the conductive layer 35 protrudes from the sides ofthe mesa 36.

As illustrated in FIG. 8C, an n-side electrode 15 is formed over thesurface of the In-poor composition layer 12A, and a p-side electrode 16is formed over the surface of the conductive layer 35. For example, avapor deposition method and a lift-off method may be applied to formthese electrodes. The conductive layer 35 with an eave-like shapeprotruding from the sides of the mesa 36 serves as a mask during vapordeposition, thus the n-side electrode 15 may not be deposited directlyunder the conductive layer 35. Hence, the edge of the n-side electrode15 that faces the mesa 36 is defined in a self-aligned manner.Accordingly, the n-side electrode 15 may be disposed close to the mesa36. Thus, resistance elements from the In-rich composition layer 12B tothe n-side electrode 15 may be reduced.

FIG. 9 is an energy band diagram of a semiconductor device according tothe third embodiment. The band gap width of the In-rich compositionlayer 12B is narrower than that of the In-poor composition layer 12A.Under a flat band state, an energy level of electrons in the lower endof the conduction band of the In-rich composition layer 12B is lowerthan an energy level of electrons in the lower end of the conductionband of the In-poor composition layer 12A. Comparison of FIG. 9 and FIG.4B reveals that, in the semiconductor device according to the thirdembodiment, a potential barrier at the bending portion of the energyband of the n-type semiconductor layer 12 is lower than the potentialbarrier of the semiconductor device according to the first embodiment.Therefore, current flows easily by direct tunneling of electrons when areverse bias is applied under the current-voltage characteristicsillustrated in FIG. 3. As a result, detection characteristics may befurther improved.

A p-side ohmic coupling layer 31 the band gap of which is narrower thanthe band gap of the p-side ohmic contact layer 32 is disposed betweenthe p-type semiconductor layer 14 and the p-side ohmic contact layer 32.The p-side ohmic contact layer 31 reduces a potential barrier due to thebending of the energy band between the p-type semiconductor layer 14 andthe p-side ohmic contact layer 32. When a reverse-bias voltage isapplied to the n-type semiconductor layer 12 and the p-typesemiconductor layer 14, transportation of electrons in the conductionband of the p-side ohmic contact layer 32 to the valence band of thep-type semiconductor layer 14 is caused. Hence, the p-type semiconductorlayer 14 and the p-side ohmic contact layer 32 are coupled with lowresistance.

FIG. 10A illustrates measurement results of current-voltagecharacteristics of the semiconductor device according to the thirdembodiment compared to measurement results of current-voltagecharacteristics of the semiconductor device according to the firstembodiment. The horizontal axis in FIG. 10A indicates applied voltage inunits of V, while the vertical axis indicates current in units of “×10⁻⁷A.” The solid lines E3 and E1 in FIG. 10A indicates the current-voltagecharacteristics of the semiconductor device according to the thirdembodiment and the first embodiment respectively. Impurity concentrationof the p-type semiconductor layer 14 is assumed to be 2×10¹⁹ cm⁻³.Impurity concentrations of the In-poor composition layer 12A and theIn-rich composition layer 12B are assumed to be 1×10¹⁹ cm⁻³. Thethickness of the In-rich composition layer 12B is assumed to be about 10nm, and the In composition ratio is assumed to be 0.63.

Compared with the semiconductor device according to the firstembodiment, the semiconductor device according to the third embodimenthas a larger flow of current when a reverse bias is applied.Characteristics of both the semiconductor devices according to the firstembodiment and the third embodiment are substantially the same when aforward bias is applied. This is because a potential barrier is low whena reverse bias is applied to the semiconductor device according to thethird embodiment.

FIG. 10B illustrates measurement results of detection sensitivity whenthe semiconductor devices according to the third embodiment and thefirst embodiment are used as a detection circuit. When input power tothe semiconductor device is set to −30 dBm, the voltage detected by thedetection circuit using the semiconductor device of the first embodimentis about 1.85 mV and the sensitivity is about 1,850 V/W, whereas thevoltage detected by the detection circuit using the semiconductor deviceof the third embodiment is about 2.50 mV and the sensitivity is about2,500 V/W. As described the above, using the semiconductor deviceaccording to the third embodiment enables a higher detection sensitivityto be obtained.

Fourth Embodiment

A manufacturing method of a semiconductor device according to a fourthembodiment will be described by referring to FIGS. 11A to 11C. Thedescription below mainly discusses processes that are different from themanufacturing method according to the third embodiment, and may notdescribe the same configurations.

As illustrated in FIG. 11A, an etching stopper layer 38 that is made upof, for example, an n-type compound semiconductor that includes In and Psuch as an n-type InP is disposed between an In-poor composition layer12A and an In-rich composition layer 12B. The thickness of the etchingstopper layer 38 may be, for example about 5 nm, and the n-type impurityconcentration is about 5×10¹⁸ cm⁻³. Other parts of the laminatedstructure are substantially the same as the structure of the thirdembodiment illustrated in FIG. 8A.

As illustrated in FIG. 11B, using a conductive film 35 as an etchingmask, each layer from a p-side ohmic contact layer 32 to the bottomsurface of the In-poor composition layer 12B is etched. The etching maybe stopped with high repeatability upon exposure of the etching stopperlayer 38.

As illustrated in FIG. 11C, the exposed part of the etching stopperlayer 38 is etched. The etching may be stopped with high repeatabilityupon exposure of the In-poor composition layer 12A. As in the thirdembodiment, an n-side electrode 15 and a p-side electrode 16 are formed.

According to the fourth embodiment, disposing the etching stopper layer38 enables to easily control depth of the etching. Thus, yield loss dueto excessive etching or insufficient etching may be suppressed.

The etching stopper layer 38 is sufficiently thin and the n-typeimpurity concentration is sufficiently high, thus, the current-voltagecharacteristics of the diode may not be influenced.

FIG. 12 illustrates measurement results of current-voltagecharacteristics of the semiconductor device according to the fourthembodiment. The horizontal axis indicates a voltage in units of V, whilethe vertical axis indicates a current in units of μA. The line “a” inFIG. 12 illustrates the current-voltage characteristics of thesemiconductor device according to the fourth embodiment. For comparison,the line “b” indicates current-voltage characteristics of a Schottkydiode.

The Schottky diode does not exhibit substantial non-linearity whereamplitude of a signal voltage is 0.3 V or less. On the other hand, thesemiconductor device according to the fourth embodiment exhibitssubstantial non-linearity characteristics even when amplitude of asignal voltage is infinitesimal, 0.3 V or less. Accordingly, efficientdetection may be achieved even with an infinitesimal signal voltage.

FIG. 13 illustrates an energy band diagram of a semiconductor deviceaccording to an alternative embodiment of the fourth embodiment. In thefourth embodiment, the etching stopper layer 38 is disposed between theIn-poor composition layer 12A and the In-rich composition layer 12B.According to the alternative embodiment, an etching stopper layer 38 isdisposed in the In-poor composition layer 12A. In this manner, theetching stopper layer 38 may be disposed in the In-poor compositionlayer 12A.

Fifth Embodiment

A manufacturing method of a semiconductor device according to a fifthembodiment will be described by referring to FIGS. 14A to 14H. Accordingto the fifth embodiment, a high electron mobility transistors (HEMT) forsignal amplification, and a diode for detection are monolithicallyformed over a single semiconductor substrate.

As illustrated in FIG. 14A, a channel layer 40, a supply layer 41, andan etching stopper layer 42 are interposed between a laminated structureof the buffer layer 11 and the In-poor composition layer 12A accordingto the fourth embodiment illustrated in FIG. 11A. However, the fifthembodiment does not include a conductive layer 35 as illustrated in FIG.11A. The channel layer 40 is formed of intrinsic InGaAs, for example,with a thickness of about 15 nm. The supply layer 41 is formed ofintrinsic InAlAs, for example, with a thickness of about 8 nm. Theetching stopper layer 42 is formed of intrinsic InP, for example, with athickness of about 5 nm.

As illustrated in FIG. 14B, each layer from a p-side ohmic contact layer32 to the upper surface of an etching stopper layer 38 is etched using aresist pattern 45 as an etching mask. For example, a mixture liquid ofphosphoric acid and hydrogen peroxide may be used for this etching. Theexposed part of the etching stopper layer 38 is etched using, forexample, a mixture liquid of hydrochloric acid and phosphoric acid.After etching the etching stopper layer 38, the resist pattern 45 isremoved.

As illustrated in FIG. 14C, the diode region and the HEMT region arecovered with a resist pattern 46. Each layer from the In-poorcomposition layer 12A to the bottom surface of the channel layer 40 isetched using the resist pattern 46 as an etching mask. For example, amixture liquid of phosphoric acid and hydrogen peroxide may be used forthe etching. This etching allows for element isolation of the diode andthe HEMT. After the etching, the resist pattern 46 is removed.

As illustrated in FIG. 14D, an n-side electrode 15 and a p-sideelectrode 16 are formed over a diode, and a drain electrode 48 and asource electrode 49 are formed over the In-poor composition layer 12A ofthe HEMT with a certain distance between the two electrodes. The drainelectrode 48 and the source electrode 49 are in ohmic contact with thechannel layer 40. The electrodes 48 and 49 are made up of a laminatedstructure in which a Ti film with a thickness of about 10 nm, a Pt filmwith a thickness of about 30 nm, and an Au film with a thickness ofabout 300 nm are laminated. For example, a vapor deposition method and alift-off method is applied to form these electrodes.

As illustrated in FIG. 14E, a resist pattern 50 with an opening for arecessed portion of the HEMT is formed by electron beam lithography. Arecess 51 is formed by etching the In-poor composition layer 12A usingthe resist pattern 50 as an etching mask. For this etching, a wetetching, for example, using a mixture liquid of citric acid and hydrogenperoxide may be employed. The etching stopper layer 42 is exposed at thebottom surface of the recess 51. After forming the recess 51, the resistpattern 50 is removed.

As illustrated in FIG. 14F, a Schottky gate electrode 54 is formed overthe bottom surface of the recess 51. The Schottky electrode 54 is madeup of a laminated structure in which a Ti film with a thickness of about10 nm, a Pt film with a thickness of about 30 nm, and an Au film with athickness of about 500 nm are laminated. For example, a vapor depositionmethod and a lift-off method is applied to form the Schottky gateelectrode 54.

As illustrated in FIG. 14G, an interlayer dielectric film 56 that ismade up of, for example, benzocyclobutene (BCB), is formed over thesemiconductor substrate 10. The interlayer dielectric film 56 covers thediode and the HEMT.

As illustrated in FIG. 14H, via holes are formed in the interlayerdielectric film 56 to form a wiring 57 between the elements. The wiring57 couples the drain electrode 48 of the HEMT and the n-side electrode15 of the diode to each other. Processes up to here form a monolithicmicrowave integrated circuit (MMIC) in which the HEMT as an amplifierelement and the diode as a detection element are integrated.

FIG. 15 illustrates an equivalent circuit diagram of a receiver using asemiconductor device according to the fifth embodiment. An amplifierelement 61 corresponds to the HEMT of the semiconductor device accordingto the fifth embodiment. A detection element 62 corresponds to the diodeof the semiconductor device according to the fifth embodiment. Anantenna 60 is coupled to an input terminal of an amplifier element 61that is the Schottky electrode 54 of the HEMT. An output terminal of theamplifier element 61 that is the drain electrode 48 is coupled to then-side electrode 15 of the detection element by the wiring 57. Thep-side electrode 16 of the detection element is grounded. Moreover, theoutput terminal of the amplifier element 61 is coupled to an outputterminal Tout of the detection circuit through an inductor 63.

The diode in the semiconductor device according to the fifth embodimentis made up of substantially the same laminated structure as thesemiconductor device according to the fourth embodiment illustrated inFIG. 11C. Thus, favorable detection characteristics may be obtained in aregion where an input signal is infinitesimal.

Sixth Embodiment

FIG. 16A is an energy band diagram of a semiconductor device accordingto a sixth embodiment. Hereunder, differences from the energy band ofthe semiconductor device according to the third embodiment will bedescribed. In the third embodiment, only the n-type semiconductor layer12 is divided into two layers that are the In-poor composition layer 12Aand the In-rich composition layer 12B; and the In-rich composition layer12B, the band gap of which is smaller than that of the In-poorcomposition layer 12A, is interposed between the In-poor compositionlayer 12A and the barrier layer 13. According to the sixth embodiment,the p-type semiconductor layer 14 is also divided into a Sb-poorcomposition layer 14A and a Sb-rich composition layer 14B. The Sb-richcomposition layer 14B the band gap of which is smaller than the Sb-poorcomposition layer 14A is interposed between the Sb-poor compositionlayer 14A and the barrier layer 13. The In-rich composition layer 12Band the Sb-rich composition layer 14 b are in contact with the barrierlayer 13.

The In composition ratio of the In-poor composition layer 12A is 0.53,the thickness is about 50 nm, and the n-type impurity concentration isabout 5×10¹⁸ cm⁻³. The In composition ratio of the In-rich compositionlayer 12B is 0.7, the thickness is about 10 nm, and the n-type impurityconcentration is about 5×10¹⁸ cm⁻³. The Sb composition ratio of theSb-poor composition layer 14A is 0.49, the thickness is about 100 nm,and the p-type impurity concentration is about 1×10¹⁹ cm⁻³. The Sbcomposition ratio of the Sb-rich composition layer 14B is 0.6, thethickness is about 10 nm, and the p-type impurity concentration is about2×10¹⁹ cm⁻³.

FIG. 16B is a sectional view of the semiconductor device according tothe sixth embodiment. The description below mainly discusses differencesfrom the semiconductor device according to the second embodimentillustrated in FIG. 7E. In the semiconductor device according to thesixth embodiment, the p-type semiconductor layer 12 illustrated in FIG.7E is divided into the In-poor composition layer 12A and the In-richcomposition layer 12B. Moreover, the p-type semiconductor layer 14 isdivided into the Sb-poor composition layer 14A and the Sb-richcomposition layer 14B. The In-rich composition layer 12B is interposedbetween the In-poor composition layer 12A and the barrier layer 13. TheSb-rich composition layer 14B is interposed between the Sb-poorcomposition layer 14A and the barrier layer 13.

In the semiconductor device according to the sixth embodiment, apotential barrier when a reverse bias is applied becomes lower than thepotential barrier of the semiconductor device according to the thirdembodiment illustrated in FIG. 9. Thus, detection characteristics may befurther improved.

The In composition ratio of the In-poor composition layer 12A ispreferably about 0.53. The Sb composition ratio of the Sb-poorcomposition layer 14A is preferably about 0.49.

The In composition ratio of the In-rich composition layer 12B is higherthan the In composition ratio of the In-poor composition layer 12A.However, excessively high In composition ratio of the In-richcomposition layer 12B makes lattice mismatch with the InP substrate 10larger, and a thickness of a film that may be formed without reducingstrain (critical film thickness) becomes thinner. An effect to lower apotential barrier may not be sufficiently obtained if the In compositionlayer 12B becomes too thin. Therefore, it is preferable that the Incomposition ratio of the In-rich composition layer 12B be higher than0.53 but less than or equal to 0.8. The thickness of the In-richcomposition layer 12B is preferably in a range of 5 nm to 20 nm.

Likewise, it is preferable that the Sb composition ratio of the Sb-richcomposition layer 14B be 0.49 or more but less than or equal to 0.8. Thethickness of the Sb-rich composition layer 14B is preferably in a rangeof 5 nm to 20 nm.

FIG. 17A is a sectional view of the semiconductor device of analternative embodiment according to the sixth embodiment. Thedescription below mainly discusses differences from the semiconductordevice according to the fourth embodiment illustrated in FIG. 11C.According to the fourth embodiment, the etching stopper layer 38 that ismade up of the n-type InP is interposed between the In-poor compositionlayer 12A and the In-rich composition layer 12B. However, an example inFIG. 17A illustrates that no etching stopper layer is interposed betweenthe In-poor composition layer 12A and the In-rich composition layer 12B.Instead, an n-side ohmic contact layer 25 of an n-type In GaAs is formedover a buffer layer 11, and the n-type InP etching stopper layer 26 isformed over the part of the region of the ohmic contact layer 25. TheIn-poor composition layer 12A is formed over this etching stopper layer26. The n-side electrode 15 is in ohmic contact with the n-side ohmiccontact layer 25.

The thickness of the n-side ohmic contact layer 25 may be, for example,about 200 nm, and the n-type impurity concentration may be, for example,about 1×10¹⁹ cm⁻³. The thickness of etching stopper layer 26 may be, forexample, about 5 nm, and the n-type impurity concentration may be, forexample, about 5×10¹⁸ cm⁻³. The film thickness, composition, andimpurity concentration of each of the n-type semiconductor layer 12, thebarrier layer 13, and the p-type semiconductor layer 14 is substantiallythe same as the configuration illustrated in FIG. 16B.

In the example illustrated in FIG. 17A, the p-type semiconductor layer14 in FIG. 11C is divided into the Sb-poor composition layer 14A and theSb-rich composition layer 14B. The energy band diagram of the n-typesemiconductor layer 12, the barrier layer 13, and the p-typesemiconductor layer 14 are substantially the same as the energy banddiagram illustrated in FIG. 16A. Accordingly, using the semiconductordevice of the alternative embodiment illustrated in FIG. 17A may obtainsubstantially the same favorable detection characteristics as using thesemiconductor device illustrated in FIG. 16B.

FIG. 17B is a sectional view of a semiconductor device of an alternativeembodiment according to the sixth embodiment. The description belowmainly discusses differences from the semiconductor device according tothe fifth embodiment illustrated in FIG. 14D. In the fifth embodiment,the etching stopper layer 38 that is made up of the n-type InP isinterposed between the In-poor composition layer 12A and the In-richcomposition layer 12B. However, the example in FIG. 17B illustrates thatno etching stopper layer is interposed between the In-poor compositionlayer 12A and the In-rich composition layer 12B. Instead, an n-sideohmic contact layer 25 of an n-type InGaAs is formed over an etchingstopper layer 42, and the n-type InP etching stopper layer 26 is formedover the part of the region of the ohmic contact layer 25. The In-poorcomposition layer 12A is formed over the etching stopper layer 26. Then-side electrode 15 is in ohmic contact with the upper surface of then-side ohmic contact layer 25.

The thickness of an intrinsic InGaAs channel layer 40, may be, forexample, about 15 nm. The thickness of an n-type InAlAs electron supplylayer 41 may be, for example, about 8 nm, and the n-type impurityconcentration, may be, for example, about 5×10¹⁸ cm⁻³. The thickness ofthe intrinsic InP etching stopper layer 42, may be, for example, about 5nm. The thickness of the n-type InGaAs ohmic contact layer 25 may be,for example, about 50 nm, and the n-type impurity concentration, may be,for example, about 1×10¹⁹ cm⁻³. The thickness of the n-type InP etchingstopper layer 26 may be, for example, about 5 nm, and the n-typeimpurity concentration, may be, for example, about 5×10¹⁸ cm⁻³.

The thickness, composition, and impurity concentration of each of then-type semiconductor layer 12, the barrier layer 13, and the p-typesemiconductor layer 14 is substantially the same as the configurationillustrated in FIG. 16B.

In the example illustrated in FIG. 17B, the p-type semiconductor layer14 illustrated in FIG. 14D is divided into the Sb-poor composition layer14A and the Sb-rich composition layer 14B. In the example illustrated inFIG. 17B, an interlayer dielectric film 56 and a wiring 57 etc., areformed as well illustrated in FIG. 14H. The energy band diagramincluding the n-type semiconductor layer 12, the barrier layer 13, andthe p-type semiconductor layer 14 is substantially the same as theenergy band diagram illustrated in FIG. 16A. Accordingly, the example inFIG. 17B may obtain favorable detection characteristics as in thedetection circuit using the semiconductor device illustrated in FIG.16B.

Seventh Embodiment

FIG. 18A is a sectional view of a semiconductor device according to aseventh embodiment. The description below may focus on differences fromthe semiconductor device according to the second embodiment illustratedin FIG. 7E. In the semiconductor device according to the seventhembodiment, the n-type semiconductor layer 12 is divided into an n-typelow concentration layer 12A and an n-type high concentration layer 12C.A p-type semiconductor layer 14 is divided into a p-type lowconcentration layer 14A and a p-type high concentration layer 14C. Then-type high concentration layer 12C is interposed between the n-type lowconcentration layer 12A and the barrier layer 13, and in contact withthe barrier layer 13. The p-type high concentration layer 14C isinterposed between the p-type low concentration layer 14A and thebarrier layer 13, and in contact with the barrier layer 13.

The n-type impurity concentration of the n-type high concentration layer12C is higher than the n-type impurity concentration of the n-type lowconcentration layer 12A. The p-type impurity concentration of the p-typehigh concentration layer 14C is higher than the p-type impurityconcentration of the p-type low concentration layer 14A. The InGaAscomposition ratio of the n-type high concentration layer 12C issubstantially the same as the InGaAs composition ratio of the n-type lowconcentration layer 12A. The GaAsSb composition ratio of the p-type highconcentration layer 14C is substantially the same as the GaAsSbcomposition ratio of the p-type low concentration layer 14A. Thesecomposition ratios are selected so as to lattice-match with InP.

FIG. 18B is an energy band diagram of the n-type semiconductor layer 12,the barrier layer 13, and the p-type semiconductor layer 14 illustratedin FIG. 18A under an equilibrium state. Hereunder, description will bemade in comparison to the energy band illustrated in FIG. 4B in which ann-type high concentration layer 12C and a p-type high concentrationlayer 14C, the impurity concentration of which are relatively high, arenot disposed. Disposing the n-type high concentration layer 12C and thep-type high concentration layer 14C with high impurity concentrations atboth sides of the barrier layer 13 makes the bending of the band larger.In other words, the bending region of the band is localized in thevicinity of the barrier layer 13. The barrier layer 13 and the extremelythin region adjacent to the barrier layer 13 make up a depletion layer.

FIGS. 19A to 19C illustrate simulation results of energy band diagramfor a p-n junction in which the p-type InGaAs layer and the n-typeInGaAs layer are joined. The horizontal axis indicates a position in thedepth direction in units of “nm.” The vertical axis indicates an energylevel of electrons in units of “eV” by assuming a Fermi level as areference. The In composition ratios of both layers are 0.53. Theposition of the depth at about 100 nm corresponds to the interface ofthe p-n junction.

The p-type impurity concentration of the p-type InGaAs layer is about2×10¹⁹ cm⁻³ in FIGS. 19A to 19C. In the example illustrated in FIG. 19A,the n-type impurity concentration of the n-type InGaAs layer is about1×10¹⁸ cm⁻³. In the example illustrated in FIG. 19B, the n-type impurityconcentration of the n-type InGaAs layer is higher compared to n-typeimpurity concentration in FIG. 19A, and is about 5×10¹⁸ cm⁻³. In theexample illustrated in FIG. 19C, the n-type InGaAs layer is made up of ahigh concentration layer and a low concentration layer. The highconcentration layer is disposed between the p-type InGaAs layer and thelow concentration layer, and the thickness is about 20 nm. The n-typeimpurity concentrations of the high concentration layer and the lowconcentration layer are about 5×10¹⁸ cm⁻³ and 1×10¹⁸ cm⁻³ respectively.

As illustrated in examples of FIGS. 19B and 19C, increasing the impurityconcentration of the n-type InGaAs layer near the interface of the p-njunction makes the bending portion of the energy band larger, and makesthe depletion layer serving as a potential barrier thinner. Therefore, atunnel current when a reverse bias is applied may be increased. Theprobability of tunneling of the p-n junction illustrated in FIGS. 19A to19C may be calculated. The tunneling probability for the examplesillustrated in FIGS. 19B and 19C are 0.888 and 0.907 respectively whilethe tunneling probability for the example of FIG. 19A is 0.779.

Comparison of the example illustrated in FIG. 19B and the exampleillustrated in FIG. 19A reveals that the energy level at the lower endof the conduction band of the n-type InGaAs layer is lower than that ofthe upper end of the valence band of the p-type InGaAs layer in both ofthe examples. The differences in energy levels are larger in the exampleillustrated in FIG. 19B than those illustrated in FIG. 19A. Thus, in theexample illustrated in FIG. 19B, when an infinitesimal forward bias isapplied to the p-n junction, electrons in the conduction band of then-type InGaAs layer are easily transported to the valence band of thep-type InGaAs layer by interband tunneling. Moreover, holes in thevalence band of the p-type InGaAs layer are easily transported to theconduction band of the n-type InGaAs layer by interband tunneling.

In the example illustrated in FIG. 19C, when an infinitesimal forwardbias is applied to the p-n junction, the energy level of electrons inthe conduction band of the n-type InGaAs layer is in the band gap of thep-type InGaAs layer. The energy level of the holes in the valence bandof the p-type InGaAs layer is in the forbidden band of the n-type InGaAslayer. Thus, almost no current flows by interband tunneling.

As described above, making a region near the p-n junction in the n-typeInGaAs layer high concentration may further suppress a current increasewhen an infinitesimal forward bias is applied compared with making allof the region of the n-type InGaAs layer high concentration.

As described above, the example illustrated in FIG. 19C enables acurrent to be increased when a reverse bias is applied and a currentincrease to be suppressed when a forward bias is applied. Therefore,non-linearity of current-voltage characteristics when an infinitesimalvoltage is applied may be improved. As a result, detectioncharacteristics when the p-n junction element is employed for thedetection circuit may be improved.

A non-linearity coefficient γ is calculated that is proportional to thedetection sensitivity of the detection circuit using the semiconductordevice with the p-n junction illustrated in FIGS. 19A to 19C. Thenon-linearity coefficient γ when the semiconductor device with the p-njunction illustrated in FIG. 19A is used is 83V−1. However, thenon-linearity coefficient γ decreases to 34V−1 when the semiconductordevice with the p-n junction illustrated in FIG. 19B is used. Thenon-linearity coefficient γ when the semiconductor device with the p-njunction illustrated in FIG. 19C is 83V−1 and this is substantially thesame amount as when the semiconductor device with the p-n junctionillustrated in FIG. 19A is used.

In FIGS. 19A to 19C, simulations are performed for a configuration inwhich the barrier layer 13 illustrated in FIGS. 18A and 18B is notdisposed. However, the same effect may be achieved even for aconfiguration in which the barrier layer 13 is disposed. A potentialbarrier may be made thinner by disposing a p-type high concentrationlayer 14C to the p-type semiconductor layer 14 side. The p-type highconcentration layer 14C may be disposed only to the p-type semiconductorlayer 14 side.

Eighth Embodiment

FIG. 20A is an energy band diagram near the p-n junction of asemiconductor device according to an eighth embodiment. Thesemiconductor device according to the eighth embodiment is made up of aconfiguration in which a barrier layer 13 is removed from thesemiconductor device according to the seventh embodiment illustrated inFIGS. 18A and 18B. Hence, the n-type high-concentration layer 12C isdirectly in contact with the p-type high concentration layer 14C.

A depletion layer generated in an extremely thin region that includesthe p-n junction serves as a potential barrier against electrons andholes. Therefore, substantially the same current-voltage characteristicsas the semiconductor device according to the seventh embodiment may beobtained.

As illustrated in FIG. 20B, a n-type high-concentration layer 12C may bedisposed only on the n-type semiconductor layer 12 side, or asillustrated in FIG. 20C, a p-type high-concentration layer 14C may bedisposed only on the p-type semiconductor layer 14 side.

Ninth Embodiment

FIG. 21A is an energy band diagram near the p-n junction of asemiconductor device according to a ninth embodiment. The semiconductordevice according to the ninth embodiment has a configuration in which abarrier layer 13 is removed from the semiconductor device according tothe sixth embodiment illustrated in FIGS. 16A and 16B. As a result, ann-type In-rich composition layer 12B is directly in contact with ap-type Sb-rich composition layer 14B.

A depletion layer generated in an extremely thin region that includesthe p-n junction interface serves as a potential barrier againstelectrons and holes. Therefore, substantially the same current-voltagecharacteristics as the semiconductor device according to the sixthembodiment may be obtained.

As illustrated in FIG. 21B, an In-rich composition layer 12B may bedisposed only on the n-type semiconductor layer 12 side, or asillustrated in FIG. 21C, a Sb-rich composition layer 14B may be disposedonly on the p-type semiconductor layer 14 side.

All examples and conditional language recited herein are intended forpedagogical purpose to aid the reader in understanding the invention andthe concepts contributed by the inventor to furthering the art, and areto be construed as being without limitation to such specifically recitedexamples and conditions, nor does the organization of such examples inthe specification relate to a showing of the superiority and inferiorityof the invention. Although the embodiments of the present inventionshave been described in detail, it should be understood that the variouschanges, substitutions, and alternations could be made hereto withoutdeparting from the spirit and scope of the invention.

1. A semiconductor device comprising: a barrier layer with a thicknessthat allows transmission of a plurality of electrons by directtunneling; and a p-type semiconductor layer and an n-type semiconductorlayer that are disposed so as to sandwich the barrier layer, wherein aband gap of the barrier layer is wider than band gaps of the n-typesemiconductor layer and the p-type semiconductor layer, wherein anenergy level of a plurality of holes at an upper end of a valence bandof the barrier layer is higher than an energy level of a plurality ofholes at an upper end of a valence band of the n-type semiconductorlayer under a state in which a flat band voltage that makes energy bandsof the n-type semiconductor layer and the p-type semiconductor layerflat is applied between the n-type semiconductor layer and the p-typesemiconductor layer; and an energy level of a plurality of electrons atthe upper end of the valence band of the p-type semiconductor layer isequal to or higher than an energy level of a plurality of electrons atthe lower end of the conduction band of the n-type semiconductor layerin a region that is further away from a bending portion of an energyband at an interface between the barrier layer and the n-typesemiconductor layer and an interface between the barrier layer and thep-type semiconductor layer, under an equilibrium state without anyvoltage being applied.
 2. A receiver comprising: a detector; and anamplifier that is coupled to the detector, wherein the detectorincludes: a barrier layer with a thickness that allows transmission of aplurality of electrons by direct tunneling, and a p-type semiconductorlayer and an n-type semiconductor layer that are disposed so as tosandwich the barrier layer, wherein a band gap of the barrier layer iswider than band gaps of the n-type semiconductor layer and the p-typesemiconductor layer; an energy level of a plurality of holes at an upperend of a valence band of the barrier layer is higher than an energylevel of a plurality of holes at an upper end of a valence band of then-type semiconductor layer under a state in which a flat band voltagethat makes energy bands of the n-type semiconductor layer and the p-typesemiconductor layer flat is applied between the n-type semiconductorlayer and the p-type semiconductor layer; and an energy level of aplurality of electrons at an upper end of a valence band of the p-typesemiconductor layer is equal to or higher than an energy level of aplurality of electrons at a lower end of a conduction band of the n-typesemiconductor layer in a region that is further away from an interfacebetween the barrier layer and the n-type semiconductor layer, and aninterface between the barrier layer and the p-type semiconductor layerthan a bending portion of the energy band at the interfaces under anequilibrium state without any voltage being applied.